|Affiliation||Department of Electrical and Electronic Information Engineering|
|Fields of Research||Magnetics / Measurement|
|Degree||Dr. of Engineering (Toyohashi University of Technology)|
|Academic Societies||The Institute of Electrical Engineers of Japan / The Magnetics Society of Japan / The Japan Society of Applied Physics / American Physical Society (APS) / The Institute of Electrical and Electronics Engineers (IEEE)|
Please append ".tut.ac.jp" to the end of the address above.
|Researcher information URL（researchmap）||Researcher information|
Main property of magnetic material is attractive or repulsive force with other magnetic ones. Not only that, but a magnetic material has relations with light, electron, wave, heat and so on. We study fundamental physics, materials and functional devises, which are related with magnetism. On the other hands, we study advanced measurement systems for magnetism, optics and material. Our research topics are as follows.
Theme1：Magneto-optical plasmonic materials
An interaction between a magnetic material and light are called as magneto-optical effect. Propagated polarized light in a magnetic material is rotated to left or right direction, which is decided by direction of magnetization. This phenomena is called as Faraday effect. Even if a thin film, to obtain large Faraday rotation angle, we investigates composite materials with Au particles and magnetic garnet film by utilizing localized surface plasmon resonance. Figure 1 (a) shows a schematic structure of the composite film, which includes Au particles with (b) periodically arranged Au particles and (c) randomly arranged Au ones. In the study, we investigate to decide wavelength of plasmon resonance and magnitude of enhanced rotation angle. Experiments and FDTD calculations are used to understand the optical and magneto-optical properties.
Theme2：Development of advanced measurement systems
We developed advanced measurement systems to obtain necessary data and also fabrication systems to prepare samples. These are a scanning tunneling microscope (STM) for observation of atoms on surface, an atomic force microscope (AFM) for observation of surface structure with sub-micrometer range, a magnetic force microscope (MFM) for obtaining magnetic structure on surface, a scanning near-field microscope (SNOM) for observation of optical images with a sub-wavelength scale, which were developed as collaboration with companies. Furthermore, we developed a laser lithography system for patterning with a micro-meter scale, a polarization measurement system for obtaining polarization states including magneto-optical effects. At present, an observation method inside a material is developed.
Title of class
Mathematics for Electrical, Electronics and Information Engineering Electromagnetism
Advanced Materials for Electronics I
Analysis of Materials at Interface